Energy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testing
- 31 December 1986
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 5 (1-4) , 547-553
- https://doi.org/10.1016/0167-9317(86)90089-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Analysis of the transit time effect on the stroboscopic voltage contrast in the scanning electron microscopeJournal of Physics D: Applied Physics, 1985
- Direct electro-optic sampling of transmission-line signals propagating on a GaAs substrateElectronics Letters, 1984
- Subpicosecond electro-optic sampling using coplanar strip transmission linesApplied Physics Letters, 1984
- Fundamentals of electron beam testing of integrated circuitsScanning, 1983