Measurement of Thickness of Dispersed Clay Flakes with the Electron Microscope
- 1 February 1960
- journal article
- Published by Cambridge University Press (CUP) in Clays and clay minerals (National Conference on Clays and Clay Minerals)
- Vol. 9 (1) , 419-423
- https://doi.org/10.1346/ccmn.1960.0090129
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Determination of Surface Structure using Ultra-High Vacuum ReplicationJournal of Applied Physics, 1960
- An improved spray droplet technique for quantitative electron microscopyBritish Journal of Applied Physics, 1958
- Evaporated carbon films for use in electron microscopyBritish Journal of Applied Physics, 1954