Singlemode 1.3 µm Fabry-Perot lasers by modesuppression
- 13 April 1995
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 31 (8) , 648-650
- https://doi.org/10.1049/el:19950413
Abstract
Focused Ga+ ion beam etched pits are used to simulate defects, reflective and nonradiative, in conventional 1.3 µm Fabry-Perot lasers. Combination of three defect sites positioned along the lasing filament results in a quasi-singlemode laser with 30 dB mode suppression and negligible rises in threshold current. The authors also report the appearance of a single enhanced spectral line below threshold.Keywords
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- Spectral width reduction in multilongitudinal mode lasers by spatial loss profilingJournal of Lightwave Technology, 1991
- Damage-induced spectral perturbations in multilongitudinal-mode semiconductor lasersJournal of Lightwave Technology, 1990