X-Ray Dose Enhancement
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 25 (6) , 1591-1597
- https://doi.org/10.1109/tns.1978.4329578
Abstract
A very simple model for the estimation of the x-ray dose enhancement at material interfaces is developed. The model is verified through comparison of estimates with Monte Carlo calculations. Additional Monte Carlo calculations are presented for dose enhancement for several conductor/polyethylene interfaces, for a gold/silicon interface with continuous x-ray spectra, and for a gold/silicon interface with a thin gold layer.Keywords
This publication has 5 references indexed in Scilit:
- Soft X-Ray Induced Electron EmissionIEEE Transactions on Nuclear Science, 1977
- An Algorithm for Energy Deposition at InterfacesIEEE Transactions on Nuclear Science, 1976
- Analytical Photo-Compton Deposition ProfilesIEEE Transactions on Nuclear Science, 1976
- Backscattering of 10-100 keV electrons from thick targetsJournal of Physics D: Applied Physics, 1975
- Monte Carlo Analysis of Dose Profiles near Photon Irradiated Material InterfacesIEEE Transactions on Nuclear Science, 1975