Scaling behavior in electrical transport across grain boundaries in superconductors
- 1 December 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 42 (16) , 10735-10737
- https://doi.org/10.1103/physrevb.42.10735
Abstract
We have found that the product of the critical current and the resistance of a grain-boundary junction scale with the resistance of the boundary. This scaling is observed to hold for a variety of samples prepared by evaporation or laser ablation and whose critical current density varies by three orders of magnitude.Keywords
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