On mobility-fluctuation origin of 1ƒ noise
- 31 December 1986
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 29 (12) , 1279-1287
- https://doi.org/10.1016/0038-1101(86)90134-6
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- One model of flicker, burst, and generation-recombination noisesPhysical Review B, 1981
- Quantum approach tonoisePhysical Review A, 1980
- Lattice scattering causes 1/ƒ noisePhysics Letters A, 1978
- Noise and admittance of the generation—Recombination current involving SRH centers in the space-charge region of junction devicesIEEE Transactions on Electron Devices, 1976
- Discussion of recent experiments on 1/ƒ noisePhysica, 1972