Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy
- 8 December 1995
- journal article
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 270 (5242) , 1646-1648
- https://doi.org/10.1126/science.270.5242.1646
Abstract
With an atomic force microscope operating in the noncontact mode in an ultrahigh vacuum, atomic-resolution imaging of the cleaved semi-insulating InP(110) surface has been achieved. By this method, atomic scale point defects and their motion were observed at room temperature, without the field-induced effects associated with scanning tunneling microscopy.Keywords
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