Auger electron spectroscopic study of the etching of cadmium telluride and cadmium manganese telluride

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Abstract
The surface compositions of Cd1−xMnxTe and CdTe that result from various chemical treatments have been studied by Auger electron spectroscopy. The depths of nonstoichiometric surface layers have been determined by sputter profiling. Bromine methanol and mineral acids leave surfaces depleted in Cd and Mn. The depth and degree of depletion is generally more severe for Mn than for Cd. Nearly stoichiometric surfaces result from soaking Cd1−xMnxTe and CdTe in water solutions with KOH. The depletion of Mn from the surface after bromine methanol etching can be reduced by dissolving Mn in the etch solution.