Intel and the myths of test

• 1 January 1996
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test of Computers
• Vol. 13  (1) , 79-81
• https://doi.org/10.1109/54.485786

Abstract

Keywords

• MYTHS
• INTEL
• TEST SYSTEM
• AUTHOR DESCRIBES
• SYSTEM DESIGNERS
• MILLION MICROPROCESSORS
• DESCRIBES DEVICE
• TEST ENGINEERS
• FACING TEST
• DEVICE TESTING