Characterization of cell cultures with ToF‐SIMS and laser‐SNMS
- 1 August 2002
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 34 (1) , 63-66
- https://doi.org/10.1002/sia.1253
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Peer Reviewed: A Subcellular Imaging by Dynamic SIMS Ion Microscopy.Analytical Chemistry, 2000
- Imaging of Boron in Tissue at the Cellular Level for Boron Neutron Capture TherapyAnalytical Chemistry, 1997
- Atomic and Molecular Imaging at the Single-Cell Level with TOF-SIMSAnalytical Chemistry, 1997
- High‐spatial‐resolution surface imaging of inorganic and organic structures by multiphoton post‐ionization of sputtered neutrals and time‐of‐flight mass spectrometrySurface and Interface Analysis, 1992
- Sample preparation of animal tissues and cell cultures for secondary ion mass spectrometry (SIMS) microscopyBiology of the Cell, 1992
- Imaging Elemental Distribution and Ion Transport in Cultured Cells with Ion MicroscopyScience, 1985