On-wafer calibration techniques for measurement of microwave circuits and devices on thin substrates
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1045-1048
- https://doi.org/10.1109/mwsym.1995.406151
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A multiline method of network analyzer calibrationIEEE Transactions on Microwave Theory and Techniques, 1991
- Characteristic impedance determination using propagation constant measurementIEEE Microwave and Guided Wave Letters, 1991
- 16-term error model and calibration procedure for on-wafer network analysis measurementsIEEE Transactions on Microwave Theory and Techniques, 1991
- Losses in GaAs microstripIEEE Transactions on Microwave Theory and Techniques, 1990