Fourier Transform spectrometry at low resolution: how low can you go?
- 31 January 1994
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
Abstract
The advantages of measuring infrared spectra at low resolution are discussed from both a theoretical and practical standpoint. Multicomponent analysis of materials with strongly overlapping bands can be achieved at resolutions at least an order of magnitude greater than the full-width at half height of the narrowest bands in the spectrum of any component. Discriminant analysis of vapor-phase spectra can be performed at a resolution of 50 cm-1 without significant loss of accuracy.Keywords
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