RF noise in 1.5 nm gate oxide MOSFETs and the evaluation of the NMOS LNA circuit integrated on a chip

This publication has 1 reference indexed in Scilit:

• 0.25 /spl mu/m salicide CMOS Technology Thermally Stable Up To 1,000/spl deg/C With High TDDB Reliability
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1997