An Ellipsometric Study of Polyaniline Film Deposition and Conversion

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Abstract
The deposition, reduction, and oxidation of polyaniline films in sulfuric and perchloric acid solutions are studied using ellipsometry. The acid type has a significant effect on the properties of the film. Of the electrolytes used here, the 0.1M aniline/0.1M perchloric acid electrolyte gives the best films in terms of smoothness, uniformity of thickness, and well‐behaved growth character. An attempt is made to show that the ellipsometric data may be used to support some existing models for polyaniline film conduction. The conversion process between oxidized and reduced states is classified as being multi‐step, with some inhomogeneity.

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