Thickness Corrections for Capacitive Obstacles and Strip Conductors
- 1 November 1960
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 8 (6) , 638-644
- https://doi.org/10.1109/tmtt.1960.1124810
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Characteristic Impedances of Broadside-Coupled Strip Transmission LinesIEEE Transactions on Microwave Theory and Techniques, 1960
- The Characteristic Impedance of the Shielded Slab LineIEEE Transactions on Microwave Theory and Techniques, 1956
- Shielded Coupled-Strip Transmission LineIEEE Transactions on Microwave Theory and Techniques, 1955
- Problems in Strip Transmission LinesIEEE Transactions on Microwave Theory and Techniques, 1955
- Analysis of the Metal-Strip Delay Structure for Microwave LensesJournal of Applied Physics, 1949
- Anwendung der Elliptischen Funktionen in Physik und TechnikPublished by Springer Nature ,1949
- XCV. The field between equal semi-infinite rectangular electrodes or magnetic pole-piecesJournal of Computers in Education, 1944