Role of tip structure in scanning tunneling microscopy
- 9 June 1986
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 48 (23) , 1597-1599
- https://doi.org/10.1063/1.96828
Abstract
An ultrahigh vacuum scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) has been built. By using the FIM image, a tungsten tip was tailored for high STM resolution in a scan of the Au(001) surface. The measured corrugation depth of the (1×5) rows was found to be a function of the size of the atomic cluster on the first plane of the tungsten tip.Keywords
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