Film thickness and width dependence of output voltage response for read-out head using induced RF permeability change
- 1 September 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 23 (5) , 2506-2508
- https://doi.org/10.1109/tmag.1987.1065351
Abstract
No abstract availableKeywords
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