Temperature and concentration dependence of the valence of Tm in (, Tm)Se and (, Tm)Se alloys, derived from LIII absorption edges
- 1 February 1985
- journal article
- Published by Elsevier in Journal of Magnetism and Magnetic Materials
- Vol. 47-48, 490-492
- https://doi.org/10.1016/0304-8853(85)90474-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Soft-x-ray resonant-photoemission study of mixed-valence TmSePhysical Review B, 1984
- -Edge X-Ray Absorption Spectroscopy: A New Tool for Dilute Mixed-Valent MaterialsPhysical Review Letters, 1983
- Theory of a mixed-valent impurityPhysical Review B, 1982
- Single-site mixed valence of thulium: A comparative photoemission study of andPhysical Review B, 1982
- X-Ray Absorption Study of Mixed-Valence TmSePhysical Review Letters, 1980