Comparison of the level crossing rate and average fade duration of Rayleigh, Rice and Nakagami fading models with mobile channel data
- 7 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 4, 1850-1857
- https://doi.org/10.1109/vetecf.2000.886139
Abstract
No abstract availableKeywords
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