Error-corrected two-state unidirectional network analyser

15 September 1988

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 24 (19) , 1197-1198
https://doi.org/10.1049/el:19880813

Abstract

A simple and easy to implement network analyser is presented which allows the measurement of all scattering parameters of an unknown device under test without the necessity of reversing it. Furthermore this network analyser can be calibrated with lower and more practicable calibration standards than comparable systems in common use. A mathematical description is presented to allow for the application of TSD or TAN calibration techniques.

Keywords

TSD
UNKNOWN DEVICE UNDER TEST
SCATTERING PARAMETERS
TAN
TWO-STAGE UNIDIRECTIONAL NETWORK ANALYSER
CALIBRATION STANDARDS

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