A new scheme for Langmuir probe measurement of transport and electron temperature fluctuations

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Abstract
A new scheme to extend the triple Langmuir probe technique for the measurement of electron temperature fluctuations and the fluctuation-driven transport has been developed. The extension is aimed at reducing the phase delay error introduced by finite probe tip separations in standard triple-probe method. The modified triple-probe scheme provides a more reliable measurement of the temperature fluctuations for a proper interpretation of the density and potential fluctuations and the transport measurement from Langmuir probe data. New results on fluctuations have been obtained from Phaedrus-T and TEXT-U tokamaks.