Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems
- 15 February 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 53 (8) , 4265-4274
- https://doi.org/10.1103/physrevb.53.4265
Abstract
We present a unified theoretical approach to electromagnetic plane waves reflected or transmitted at arbitrarily anisotropic and homogeneous layered systems. Analytic expressions for the eigenvalues for the four-wave components inside a randomly oriented anisotropic medium are reported explicitly. As well, the partial transfer matrix for a slab of a continuously twisted biaxial material at normal incidence is described. Transition matrices for the incident and exit media are presented. Hence, a complete analytical 4×4 matrix algorithm is obtained using Berreman’s 4×4 differential matrices [D. W. Berreman, J. Opt. Soc. Am. 62, 502 (1972)]. The algorithm has a general approach for materials with linear optical response behavior and can be used immediately, for example, to analyze ellipsometric investigations. © 1996 The American Physical Society.Keywords
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