X-ray photoelectron spectroscopy study of chemically-etched NdCeCuO surfaces
- 30 April 1991
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 78 (4) , 303-306
- https://doi.org/10.1016/0038-1098(91)90202-7
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Effects of Ce substitution and and reduction on the electronic states of studied by x-ray photoelectronPhysical Review B, 1990
- X-ray photoelectron spectroscopy of Nd2−xCexCuO4−y (x=0 and 0.15) thin filmsJournal of Applied Physics, 1990
- Electronic structure of the electron-doped superconductor studied by photoemission spectroscopyPhysical Review B, 1990
- Resonant-photoemission study ofPhysical Review B, 1990
- Resonant photoemission study of : Nature of electronic states near the Fermi levelPhysical Review Letters, 1990
- Valence-band and Cu 2p core-level electronic structures of Nd2−xCexCuO4 studied by X-ray photoemissionSolid State Communications, 1989
- X-Ray Photoemission Spectroscopy of Nd2-xCexCuO4-y and La2-xSrxCuO4Japanese Journal of Applied Physics, 1989
- Electronic Structure of Nd
2-
x
Ce
x
CuO 4-δ Studied by Photoelectron SpectroscopyEurophysics Letters, 1989
- A core-level photoemission spectroscopic study of the electron-doped superconductor, Nd2-xCexCuO4-δSolid State Communications, 1989
- Valence State of Cu in Nd2-xCexCuO4 SystemJapanese Journal of Applied Physics, 1989