Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors
- 1 September 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 5 (1) , 39-43
- https://doi.org/10.1016/0168-583x(84)90567-6
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A radially dependent photopeak efficiency model for Si(Li) detectorsNuclear Instruments and Methods, 1980
- Si(Li) detector efficiency for 0.7–6 keV X-ray energy regionNuclear Instruments and Methods, 1979
- An inter-comparison of efficiency-calibration techniques for semiconductor X-ray detectorsNuclear Instruments and Methods, 1975
- Exchange corrections ofx-ray emission ratesPhysical Review A, 1974