Characterization of SiO using fine features of X-ray K emission spectra
- 1 May 1971
- Vol. 21 (5) , 165-166
- https://doi.org/10.1016/0042-207x(71)91795-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Silicon Monoxide: Fact or FictionVacuum, 1970
- The origin and intensities of low energy satellite lines in X-ray emission spectra: a molecular orbital interpretationJournal of Physics C: Solid State Physics, 1970
- Silicon valence in SiO films studied by X-ray emissionSolid State Communications, 1964