Shape Memory Behavior of Ti-Ni Thin Films Annealed at Various Temperatures
- 1 January 1994
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Shape Memory Characteristics of Sputter-Deposited Ti–Ni Thin FilmsMaterials Transactions, JIM, 1994
- Shape memory thin film of TiNi formed by sputteringThin Solid Films, 1993
- Thin-film processing of TiNi shape memory alloySensors and Actuators A: Physical, 1990
- Development of Shape Memory Properties in Sputter Deposited Films of Nickel - Titanium AlloysMaterials Science Forum, 1990