The role of Ar+, CH+4, O+2and backscattered Pb+ ions during Nb/Oxide/PbAuIn edge junction fabrication
- 1 March 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 21 (2) , 118-121
- https://doi.org/10.1109/tmag.1985.1063825
Abstract
No abstract availableKeywords
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