Raman Microprobe Analysis of Thin Films Formed on the Surface of Silver Electrical Contacts Utilizing the Surface-Enhanced Raman Scattering Effect

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Abstract
The laser Raman microprobe has been used in combination with Auger electron spectroscopy for the investigation of thin films formed on the surface of polycrystalline silver relay contacts to illustrate the analytical application of the surface-enhanced Raman scattering (SERS) phenomenon to the evaluation of industrial materials. Raman scattering of thin carbon layers on Ag evaporated films has also been examined in order to confirm the enhancement effect on the Ag surface. From the observed enhanced Raman scattering, carbon and sulfur compounds such as silver sulfate have been identified in the thin films formed on Ag contacts operated repeatedly under several kinds of controlled gas flows. These results demonstrate the possibility of a wide range of application of the SERS effect as an useful analytical method with a high surface sensitivity.

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