Quality assurance and testing before, during, and after construction of semiconductor tracking detectors
- 1 December 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 383 (1) , 223-228
- https://doi.org/10.1016/s0168-9002(96)00618-3
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The OPAL silicon strip microvertex detector with two coordinate readoutNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1994
- The OPAL silicon-tungsten calorimeter front end electronicsIEEE Transactions on Nuclear Science, 1994
- The OPAL detector at LEPNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1991