Learning approach to nonlinear fault diagnosis: detectability analysis
- 1 April 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automatic Control
- Vol. 45 (4) , 806-812
- https://doi.org/10.1109/9.847127
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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