Surface Film Thickness Determination by Reflectance Measurements
- 1 June 1973
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 12 (6) , 1271-1275
- https://doi.org/10.1364/ao.12.001271
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Spectral Reflectivity Measurements Using Fiber OpticsApplied Optics, 1973
- Oxidation of a Ternary Uranium AlloyJournal of Vacuum Science and Technology, 1971
- Growth of oxide films onto cleavage faces of crystalline UCSurface Science, 1968