A program to calculate the variance of X-ray line profiles
- 1 November 1969
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 2 (5) , 193-196
- https://doi.org/10.1107/s0021889869006960
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: