Investigation of the structural disorder fluctuations in a a-Si:H films by coupled X-ray diffractometry and photodeflection spectroscopy
- 1 December 1987
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 97-98, 191-194
- https://doi.org/10.1016/0022-3093(87)90045-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Structural, optical and transport properties of sputtered hydrogenated amorphous silicon films in relation to Si-H bonding configurationsPhilosophical Magazine Part B, 1985
- Disorder and density of defects in hydrogenated amorphous silicon-carbonSolid State Communications, 1985