Ion microprobe trace element analysis with high mass resolution
- 31 December 1976
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 22 (3-4) , 333-338
- https://doi.org/10.1016/0020-7381(76)80093-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A combined ion probe/spark source analysis systemVacuum, 1974
- Secondary ion mass spectrometry of rare earth elementsAnalytical Chemistry, 1974
- Secondary ion mass analysis, Technique for three-dimensional characterizationAnalytical Chemistry, 1972
- Ion Microprobe Mass AnalyzerJournal of Applied Physics, 1967