Improvement of the mass resolution of the atom probe using a dual counter-electrode
- 1 October 2002
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 95, 239-249
- https://doi.org/10.1016/s0304-3991(02)00322-4
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Design of a scanning atom probe with improved mass resolutionReview of Scientific Instruments, 2000
- Implementation of an optical TAP: preliminary resultsUltramicroscopy, 1998
- Performance of an energy-compensated three-dimensional atom probeReview of Scientific Instruments, 1998
- Magnification and mass resolution in local-electrode atom probesUltramicroscopy, 1996
- Improvement of the detection efficiency of channel plate electron multiplier for atom probe applicationApplied Surface Science, 1996
- On the many advantages of local-electrode atom probesUltramicroscopy, 1996
- Improvements in three-dimensional atom probe designApplied Surface Science, 1994
- An atom probe for three-dimensional tomographyNature, 1993
- Multiple-focusing time-of-flight mass spectrometers Part II. TOFMS with equal energy accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1972