THE DETERMINATION OF GRAIN BOUNDARY SEGREGATION PROFILES IN BORON CONTAINING AUSTENITIC STAINLESS STEELS USING TEM, AP AND IAP

Publisher Website
Google Scholar
Abstract
A combination of transmission electron microscopy (TEM), field-ion microscopy (FIM), atom-probe (AP), and imaging atom-probe (IAP) has been used to study grain boundary segregation in two boron containing austenitic stainless steels. Segregation profiles for B, Mo, Ni, and Fe are presented. It is shown that, by the use of a combination of techniques, concentration profiles can be determined with high spatial resolution regardless of the grain boundary orientation

This publication has 0 references indexed in Scilit: