Influence of R.F. sputter parameters on the magnetic orientation of Co-Cr layers
- 1 January 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 20 (1) , 57-59
- https://doi.org/10.1109/tmag.1984.1063033
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- R.f.-sputtered Co-Cr layers for perpendicular magnetic recording I: Structural propertiesThin Solid Films, 1983
- Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometryAnalytica Chimica Acta, 1982
- Co-Cr films for perpendicular recordingIEEE Transactions on Magnetics, 1981
- Co-Cr recording films with perpendicular magnetic anisotropyIEEE Transactions on Magnetics, 1978