Comprehensive characterization of CdTe and (Cd, Zn)Te single crystals by a chemical etchant
- 1 April 1989
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 24 (4) , 365-369
- https://doi.org/10.1002/crat.2170240405
Abstract
Using a known chemical etchant low‐ and high angle boundaries and lamellar twins can be seen on CdTe and (Cd, Zn)Te crystal ingots as a whole as well as on slices with naked eyes. Also the polarity of {111} samples can be determined in this way. Etch pits are produced on cut and polished surfaces independent of their crystallographic orientation. A new modified etchant was used to study the low angle subgrain structure on (111)Te surfaces.Keywords
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