Single-Specimen FEM-LEED Studies: Carbon on Tungsten
- 1 April 1969
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 40 (5) , 2330-2334
- https://doi.org/10.1063/1.1657983
Abstract
Field‐electron microscopy and low‐energy‐electron diffraction can be used in a complementary manner. A method of making such a direct combination on a single specimen is described and applied to a study of the problem of carbon contamination of tungsten surfaces. It is shown that, within the sensitivity of the apparatus used, carbon may be present and remain undetected by the display mode of LEED on a (nonperfect) (011)‐oriented W LEED specimen.This publication has 10 references indexed in Scilit:
- Ellipsometry, low-energy electron diffraction and field electron microscopy combinedSurface Science, 1968
- A note on the sensitivity of leed to surface perfectionSurface Science, 1967
- Leed and heed studies of the interaction of oxygen with single crystal surfaces of copperSurface Science, 1967
- Energy Spectra of Inelastically Scattered Electrons and LEED Studies of TungstenJournal of Applied Physics, 1967
- Diffraction study of oxygen adsorption on a (110) tungsten faceSurface Science, 1966
- Low energy electron diffraction study of the polar {111} surfaces of GaAs and GaSbSurface Science, 1966
- ELECTRON DIFFRACTION IN SURFACE CHEMISTRYIndustrial & Engineering Chemistry, 1965
- On the Magnification and Resolution of the Field Emission Electron MicroscopeJournal of Applied Physics, 1956
- Work Function of Tungsten Single Crystal Planes Measured by the Field Emission MicroscopeJournal of Applied Physics, 1955
- Electron Emission and Diffraction by a Copper CrystalPhysical Review B, 1929