Non-destructive thickness determination of thin cobalt and cobalt disilicide layers on silicon substrates

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• Characterization by spectroscopic ellipsometry of buried layer structures in silicon formed by ion beam synthesis
  Materials Science and Engineering: B, 1992
• Algorithms for the rapid simulation of Rutherford backscattering spectra
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985