Frequency markers providing resolution of 1 kHz for sweptmicrowave measurements

18 April 1974

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 10 (8) , 123-124
https://doi.org/10.1049/el:19740094

Abstract

The letter describes a method of generating high-precision frequency markers for swept-microwave measurements, using a spectrum analyser. Narrowband parameters, such as the Q factors of microwave cavities, can be measured with a resolution of 1 kHz.

Keywords

SWEPT FREQUENCY OSCILLATORS
FREQUENCY MARKERS
SPECTRAL ANALYSERS
PULSE GENERATORS
Q FACTOR MEASUREMENT
1KHZ
MICROWAVE MEASUREMENT
CAVITY RESONATORS

This publication has 0 references indexed in Scilit: