High spatial resolution photo-oxidation of a-Si:C at low temperatures H films

Abstract
Ultraviolet illumination of hydrogenated amorphous siliconcarbon alloys, a-Si:C:H, produces oxide patterns with a resolution better than 5μm. Notably, the photoinduced oxidation occurs at temperatures less than 50°C for a-Si:C:H films with a carbon content > 30 atomic %. Possible applications include photolithography, apertured membranes, archival optical storage and gate insulators for thin-film transistors.

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