Microwave dielectric measurements using time domain spectroscopy: note on recent technique advances

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Abstract
Use of the techniques of time domain spectroscopy (TDS) to determine the microwave properties of materials is a rapidly developing field. Two recent advances in techniques are described. Firstly, a method for reducing the uncertainty with which the time domain waveform can be referred to a common time origin which permits 'time referencing' to better than 0.08 ps-more than an order of magnitude improvement on the use of more conventional 'time markers'-and requires only the basic TDS instrumentation, and secondly, a variation in TDS technique involving the use of a high pass filter. By eliminating the effects of 'low frequency noise', a better defined pulse shape for Fourier transformation is produced, thus reducing truncation errors.