Coverage and structure of ultrathin Pd films on Cu(100)

Abstract
The deposition of Pd on Cu(100) at 300 K was studied by low-energy electron diffraction (LEED), Auger-electron spectroscopy, and Rutherford-backscattering spectrometry. A clear maximum in the c(2×2) LEED pattern intensity occurred at a Pd coverage of 0.55±0.05 monolayers (ML), consistent with the surface-alloy model for this system. Breakpoints in the Auger intensity versus deposition-time curves were seen at 0.47±0.05 and 0.93±0.11 ML. A p(2×2) LEED pattern was observed near 1-ML Pd coverage.