Coverage and structure of ultrathin Pd films on Cu(100)
- 15 November 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 44 (20) , 11518-11520
- https://doi.org/10.1103/physrevb.44.11518
Abstract
The deposition of Pd on Cu(100) at 300 K was studied by low-energy electron diffraction (LEED), Auger-electron spectroscopy, and Rutherford-backscattering spectrometry. A clear maximum in the c(2×2) LEED pattern intensity occurred at a Pd coverage of 0.55±0.05 monolayers (ML), consistent with the surface-alloy model for this system. Breakpoints in the Auger intensity versus deposition-time curves were seen at 0.47±0.05 and 0.93±0.11 ML. A p(2×2) LEED pattern was observed near 1-ML Pd coverage.Keywords
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