A quantitative explanation of low-energy tailing features of Si(Li) and Ge X-ray detectors, using synchrotron radiation
- 8 December 1998
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 418 (2-3) , 394-404
- https://doi.org/10.1016/s0168-9002(98)00889-4
Abstract
No abstract availableKeywords
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