On the photodeflection method applied to low thermal diffusivity measurements
- 1 June 1993
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (6) , 1576-1583
- https://doi.org/10.1063/1.1144029
Abstract
The photodeflection method when applied to measure the low thermal diffusivity of some materials gives inconsistent results. In this article a way to extend the thermal diffusivity range of measurements using the phase of the photodeflection signal is presented. A comparison with computer simulations and experimental results shows good agreement.Keywords
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