Further evaluation of the Exicor birefringence measurement system
- 11 October 2000
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 4103, 12-19
- https://doi.org/10.1117/12.403586
Abstract
We recently developed a linear birefringence measurement instrument, known as the Exicor system, using photoelastic modulator (PEM) technology. We have reported the precision and short-term stability of this instrument. In this paper, the author further evaluates the accuracy, long-term stability, and instrumental performance under low light intensity levels of the Exicor system.Keywords
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