Interferometry using convergent electron diffracted beams plus an electron biprism (CBED + EBI)
- 31 August 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 60 (1) , 153-169
- https://doi.org/10.1016/0304-3991(95)00051-2
Abstract
No abstract availableKeywords
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