Probability density functions for multilook polarimetric signatures
- 1 May 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Geoscience and Remote Sensing
- Vol. 32 (3) , 562-574
- https://doi.org/10.1109/36.297975
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Maximum likelihood estimation of K distribution parameters for SAR dataIEEE Transactions on Geoscience and Remote Sensing, 1993
- Texture and speckle in high resolution synthetic aperture radar clutterIEEE Transactions on Geoscience and Remote Sensing, 1993
- Derivation of phase statistics from the Mueller matrixRadio Science, 1992
- Statistical and spatial properties of forest clutter measured with polarimetric synthetic aperture radar (SAR)IEEE Transactions on Geoscience and Remote Sensing, 1992
- The TOPSAR interferometric radar topographic mapping instrumentIEEE Transactions on Geoscience and Remote Sensing, 1992
- Information from SAR imagesJournal of Physics D: Applied Physics, 1991
- Studies of multibaseline spaceborne interferometric synthetic aperture radarsIEEE Transactions on Geoscience and Remote Sensing, 1990
- Multiply stochastic representations for K distributions and their Poisson transformsJournal of the Optical Society of America A, 1989
- Generalized K distribution: a statistical model for weak scatteringJournal of the Optical Society of America A, 1987
- On the statistics of K-distributed noiseJournal of Physics A: General Physics, 1980