HVEM Structure Images of Extended 60° - and Screw Dislocations in Silicon
- 1 March 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (3) , L155-L158
- https://doi.org/10.1143/jjap.19.l155
Abstract
Structure images showing the end-on views of extended 60° - and screw dislocations in silicon crystals are observed with a high voltage electron microscope using the axial illuminating technique. The mean width of 60° dislocations is measured to be 68.7±3.3 Å from which the energy of the intrinsic stacking fault is estimated to be 48.7±2.4 mJm-2.Keywords
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